JPH0545904B2 - - Google Patents

Info

Publication number
JPH0545904B2
JPH0545904B2 JP62261774A JP26177487A JPH0545904B2 JP H0545904 B2 JPH0545904 B2 JP H0545904B2 JP 62261774 A JP62261774 A JP 62261774A JP 26177487 A JP26177487 A JP 26177487A JP H0545904 B2 JPH0545904 B2 JP H0545904B2
Authority
JP
Japan
Prior art keywords
light
temperature
receiving element
semiconductor
differential amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62261774A
Other languages
English (en)
Japanese (ja)
Other versions
JPH01105134A (ja
Inventor
Tadashi Nohira
Tsuneo Imazu
Ikuzo Kagami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KOMATSUGAWA KAKOKI KK
Original Assignee
KOMATSUGAWA KAKOKI KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KOMATSUGAWA KAKOKI KK filed Critical KOMATSUGAWA KAKOKI KK
Priority to JP62261774A priority Critical patent/JPH01105134A/ja
Priority to US07/257,635 priority patent/US4891519A/en
Publication of JPH01105134A publication Critical patent/JPH01105134A/ja
Publication of JPH0545904B2 publication Critical patent/JPH0545904B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
    • G01N21/534—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke by measuring transmission alone, i.e. determining opacity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G01N21/8507—Probe photometers, i.e. with optical measuring part dipped into fluid sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/444—Compensating; Calibrating, e.g. dark current, temperature drift, noise reduction or baseline correction; Adjusting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G01N2201/0612—Laser diodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/08—Optical fibres; light guides
    • G01N2201/0806—Light rod

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP62261774A 1987-10-19 1987-10-19 測光装置 Granted JPH01105134A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP62261774A JPH01105134A (ja) 1987-10-19 1987-10-19 測光装置
US07/257,635 US4891519A (en) 1987-10-19 1988-10-14 Photometering apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62261774A JPH01105134A (ja) 1987-10-19 1987-10-19 測光装置

Publications (2)

Publication Number Publication Date
JPH01105134A JPH01105134A (ja) 1989-04-21
JPH0545904B2 true JPH0545904B2 (en]) 1993-07-12

Family

ID=17366512

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62261774A Granted JPH01105134A (ja) 1987-10-19 1987-10-19 測光装置

Country Status (2)

Country Link
US (1) US4891519A (en])
JP (1) JPH01105134A (en])

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4976871A (en) * 1989-10-17 1990-12-11 Nalco Chemical Company Method of monitoring flocculant effectiveness
JPH04130058U (ja) * 1991-05-21 1992-11-30 日野自動車工業株式会社 光透過式スモークメータ
WO1994007127A1 (en) * 1992-09-14 1994-03-31 Sippican, Inc. Apparatus and method for measuring chemical concentrations
US5412581A (en) * 1992-11-05 1995-05-02 Marathon Oil Company Method for measuring physical properties of hydrocarbons
JP3115739B2 (ja) * 1993-01-27 2000-12-11 シャープ株式会社 パルス光受信回路
JPH0687850U (ja) * 1993-05-28 1994-12-22 株式会社サタコエンジニヤリング 透視度測定装置
US5793044A (en) * 1995-11-09 1998-08-11 Ntc Technology, Inc. Infrared radiation detector units and methods of assembling transducers in which said units are incorporated
FR2763685B1 (fr) * 1997-05-23 1999-07-23 Lasertec International Appareil de mesure de l'evolution des caracteristiques optiques d'un milieu liquide ou gazeux en circulation
JP4187376B2 (ja) * 2000-02-16 2008-11-26 ローム株式会社 受光増幅装置
RU2196979C2 (ru) * 2001-02-19 2003-01-20 ООО "Форатех" Способ автоматической коррекции градуировки датчиков и датчик рентгенофлуоресцентного контроля химсостава сырья в транспортном потоке
RU2184354C1 (ru) * 2001-04-16 2002-06-27 Акционерная компания "АЛРОСА" (Закрытое акционерное общество) Способ измерения интенсивности ультрафиолетового излучения солнца и устройство для его осуществления
RU2205387C2 (ru) * 2001-05-15 2003-05-27 Уральский государственный технический университет Способ измерения модуля упругости углеродных жгутов
RU2204822C2 (ru) * 2001-08-15 2003-05-20 Государственное образовательное учреждение Воронежская государственная технологическая академия Способ определения количества мономолекулярно-адсорбционной и полимолекулярно-адсорбционной влаги
RU2210835C2 (ru) * 2001-10-31 2003-08-20 Московский государственный институт стали и сплавов (технологический университет) Оптический способ контроля редкоземельных примесей в монокристаллических ферритах-гранатах
RU2206143C1 (ru) * 2001-10-31 2003-06-10 Московский государственный институт стали и сплавов (технологический университет) Способ определения концентрации ионов свинца в монокристаллических ферритах-гранатах
RU2210059C1 (ru) * 2001-11-30 2003-08-10 Закрытое акционерное общество Научно-исследовательский институт интроскопии Московского научно-производственного объединения "Спектр" Рентгеновский толщиномер
US7068362B2 (en) * 2002-01-25 2006-06-27 The Johns Hopkins University Expendable beam transmissometer
RU2217708C2 (ru) * 2002-02-05 2003-11-27 Стрепетов Александр Николаевич Времяпозиционный детектор излучения
RU2217712C2 (ru) * 2002-02-08 2003-11-27 Федеральное государственное унитарное предприятие "Смоленское производственное объединение "Аналитприбор" Термоэлектрический приёмник излучения
RU2215260C1 (ru) * 2002-03-14 2003-10-27 Закрытое акционерное общество Научно-исследовательский институт интроскопии Московского научно-производственного объединения "Спектр" Рентгеновский измеритель толщины
US7045752B2 (en) * 2003-06-30 2006-05-16 Intel Corporation Illuminated and non-illuminated photodiodes for monitoring and controlling AC and DC components of a laser beam
US20050190370A1 (en) * 2004-02-26 2005-09-01 Rosemount Analytical Inc. Turbidity sensing system with reduced temperature effects
JP2006040976A (ja) * 2004-07-22 2006-02-09 Hamamatsu Photonics Kk 光検出器
JP5161625B2 (ja) * 2008-03-26 2013-03-13 セイコーＮｐｃ株式会社 照度センサ
JP5318548B2 (ja) * 2008-12-08 2013-10-16 ラピスセミコンダクタ株式会社 光量測定装置
FR2966595B1 (fr) * 2010-10-26 2013-01-25 Commissariat Energie Atomique Dispositif de detection d'un rayonnement electromagnetique.
JP6205162B2 (ja) * 2013-04-12 2017-09-27 パナソニック デバイスＳｕｎｘ株式会社 光電センサ及び受光器
JP6416879B2 (ja) * 2014-03-28 2018-10-31 テルモ株式会社 蛍光センサ
JP2016080430A (ja) * 2014-10-14 2016-05-16 住友電気工業株式会社 光プローブ及び測定装置
JP2016213307A (ja) * 2015-05-07 2016-12-15 新日本無線株式会社 反射型センサ装置及びその製造方法
GB2560376B (en) 2017-03-10 2020-02-12 Toshiba Kk On-Chip Integration of a Bias Tee and a Single Photon Detector
CN108132097A (zh) * 2017-12-18 2018-06-08 北京泊菲莱科技有限公司 一种探测器探头、光功率计以及光功率测量方法
CN118401813A (zh) 2021-12-15 2024-07-26 特里纳米克斯股份有限公司 用于测量光辐射的光电检测器

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4072424A (en) * 1976-01-30 1978-02-07 Mcmullan James P Optical device for measuring the turbidity of a liquid
US4319138A (en) * 1980-03-06 1982-03-09 Shaban Manufacturing Ltd. Housing for turbidimeter sensor
JPS60144458U (ja) * 1984-03-05 1985-09-25 ホーチキ株式会社 火災検出装置
JPS60259935A (ja) * 1984-06-07 1985-12-23 Komatsugawa Kakoki Kk 濁度計
JPS61251749A (ja) * 1985-04-30 1986-11-08 Yokogawa Electric Corp 紙の光学的特性測定装置

Also Published As

Publication number Publication date
US4891519A (en) 1990-01-02
JPH01105134A (ja) 1989-04-21

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